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Factory Mobile Computing Proves Enterprise Value of 2-in-1 Devices

Intel IT is deploying 2-in-1 combination laptop and tablet mobile computing devices to improve productivity and produce time and cost savings.

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Electrical Testing and Platform Validation

Electrical tests like PC platform validation and ATE, combined with observations and commonality analysis, determine product functional analysis flow.

Non-Destructive Testing

Non-destructive techniques like X-ray, SAM, SQUID, TDR, and thermal imaging provide data without altering the electronic device; details provided.

Parametric Fault Isolation

Parametric fault isolation analyzes electrical behavior of input/output circuitry using an SPA; includes graph.

Physical and Composition Analysis

Describes focused ion beam, scanning electron microscopy, and transmission electron microscopy tools used in physical and composition analysis.

Product Identification and Unit-Level Traceability

Intel’s system to manage and store product ID with unit-level traceability for CPUs and chipsets, and lot-level traceability for boards and systems.

Control of Nonconforming Products

Review and disposition process of nonconforming products like wafer fab plants, assembly and test sites, distribution centers, and business divisions.

Design for Manufacturability

Explains advantages and Intel’s reason for addressing product issues using the design for manufacturability system, a way to address problems early.

Logic Fault Isolation

Logic fault isolation processes ID specific nodes for further analysis and use mostly automated tools leveraging design for testability features.

Intel® 6300ESB I/O Controller Hub Datasheet

For Original Equipment Manufacturers and BIOS vendors creating products based on the Intel® 6300ESB I/O Controller Hub.

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