Fab 28 and IDPj ISO 9001:2008
Certifies that Intel Corporation—Fab 28 and IDPj in Qiryat Gat, Israel, comply with the ISO 9001:2008 requirements of wafer fabrication, associated equipment, and processes.
Read the full Fab 28 and IDPj ISO 9001:2008 Certification.
Shows how to attach Vishay strain gage to Intel® Ball Grid Array packages; measures board flexure.
Intel’s ESD prevention methods prevent costly damage to electronic devices.
Demos removing and replacing damaged ball grid array socket components for motherboard repair.
PoP device rework demos thermal reflow profile, PCB pad site, and new component preparation.
Demos antenna and oscilloscope use for ESD detection, minimum tool requirements, and parameter setup.
Demos processor insertion and removal with Intel® LGA771 Series and Intel® LGA775 Series sockets.